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Search: "[ author: Young Soon Kim ]" (3)
A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution
Joong Yang Park , Jae Heung Park , Young Soon Kim The KIPS Transactions:PartD,
Vol. 11, No. 6, pp. 1287-1294,
Oct.
2004
10.3745/KIPSTD.2004.11.6.1287
10.3745/KIPSTD.2004.11.6.1287
An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment
Joong Yang Park, Young Soon Kim, Yang Sook Hwang The KIPS Transactions:PartD,
Vol. 9, No. 4, pp. 659-666,
Aug.
2002
10.3745/KIPSTD.2002.9.4.659
10.3745/KIPSTD.2002.9.4.659
An Input Domain - Based Software Reliability Growth Model
Joong Yang Park, Dong Woo Seo, Young Soon Kim The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 7, No. 11, pp. 3384-3393,
Nov.
2000
10.3745/KIPSTE.2000.7.11.3384
10.3745/KIPSTE.2000.7.11.3384
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Vol. 13, 2024
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Vol. 12, 2023
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Vol. 11, 2022
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Vol. 10, 2021
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Vol. 9, 2020
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Vol. 8, 2019
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Vol. 7, 2018
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Vol. 2, 2013
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Vol. 1, 2012
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